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» General Information » Immunity » Conducted RF     Conducted RF Test The source of disturbance covered by this test is basically an electromagnetic field, coming from intended RF transmitters, that may act on the whole length of cables connected to an installed equipment. The dimensions of the disturbed equipment, mostly a sub-part of a larger system, are assumed to be small compared with the wavelengths involved. The in-going and out-going leads: e.g. mains, communication lines, interface cables, behave as passive receiving antenna networks because they can be several wavelengths long. Between those cable networks, the susceptible equipment is exposed to currents flowing "through" the equipment. Cable systems connected to an equipment are assumed to be in resonant mode (l /4, l /2 open or folded dipoles) and as such are represented by coupling and decoupling devices having common-mode impedance or 150W with respect to a ground reference plane. This test subjects the EUT to a source of disturbance comprising electric and magnetic fields, simulating those coming from intentional RF transmitters. These disturbing fields (E and H) are approximated by the electric and magnetic near-fields resulting from the voltages and currents caused by the test set-up. The EUT is subjected to an electromotive force (e.m.f.) of 3 V or 10 V from 150 kHz to 80 MHz. This frequency range is 80% amplitude modulated with a 1 kHz sine wave. The signal generator provides the modulated frequency at a step rate of 1% of fundamental to the RF amplifier. The dwell time at each frequency is not less than the time necessary for the EUT to be exercised, and able to respond. Clamp injection on all cables of the EUT is used to couple the e.m.f. to the EUT. No tests are required for induced disturbances caused by electromagnetic fields coming from intentional RF transmitters in the frequency range 9 kHz to 150 kHz. Frequency Range: 150 kHz to 80 MHz Test Levels Level Voltage level (e.m.f.) Uo [dB(m V)] Uo [V] 1 120 1 2 130 3 3 140 10 X Special "X" is an open test level.   « Back Top Next »

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